The influence of the joint size on low cycle fatigue characteristic of Sn-Ag-Cu has been investigated by a micro size joint specimen fabricated using solder balls. Although the effect of joint size on crack initiation life is not obvious at 298K, the reduction of the joint size changes the cyclic strain hardening nature and the fracture behavior that induces the life reduction at 398K. With a decrease in size, the failure mechanism transforms from a transgranular fracture to an intergranular fracture at the high energy grain boundary that is formed by high angle boundary formation following dynamic recovery in whole of joint. Therefore, the failure life is greatly reduced as a complete failure occurs simultaneously with the crack initiation at the grain boundaries. This is more remarkable at higher temperatures.
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ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems
July 6–8, 2011
Portland, Oregon, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
978-0-7918-4462-5
PROCEEDINGS PAPER
Fatigue Life and Fracture Behavior of Micro Size Sn-Ag-Cu Solder Joint
Tashiro Naoki,
Tashiro Naoki
Shibaura Institute of Technology, Tokyo, Japan
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Yoshiharu Kariya,
Yoshiharu Kariya
Shibaura Institute of Technology, Tokyo, Japan
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Yoshihiko Kanda
Yoshihiko Kanda
Shibaura Institute of Technology, Tokyo, Japan
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Tashiro Naoki
Shibaura Institute of Technology, Tokyo, Japan
Yoshiharu Kariya
Shibaura Institute of Technology, Tokyo, Japan
Yoshihiko Kanda
Shibaura Institute of Technology, Tokyo, Japan
Paper No:
IPACK2011-52104, pp. 707-712; 6 pages
Published Online:
February 14, 2012
Citation
Naoki, T, Kariya, Y, & Kanda, Y. "Fatigue Life and Fracture Behavior of Micro Size Sn-Ag-Cu Solder Joint." Proceedings of the ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems. ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, MEMS and NEMS: Volume 2. Portland, Oregon, USA. July 6–8, 2011. pp. 707-712. ASME. https://doi.org/10.1115/IPACK2011-52104
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