Electrical impedance of a two-phase mixture is a function of void fraction and phase distribution. The difference in the electrical conductance and permittivity of the two phases can be exploited to measure electrical impedance for obtaining void fraction and flow regime characteristics. An electrical impedance meter is constructed for the measurement of void fraction in microchannel two-phase flow. The experiments are conducted in air-water two-phase flow under adiabatic conditions. A transparent acrylic test section of hydraulic diameter 780 micrometer is used in the experimental investigation. The impedance void meter is calibrated against the void fraction measured using analysis of images obtained with a high-speed camera. Based on these measurements, a methodology utilizing the statistical characteristics of the void fraction signals is employed for identification of microchannel flow regimes.
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ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems
July 6–8, 2011
Portland, Oregon, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
978-0-7918-4462-5
PROCEEDINGS PAPER
Impedance-Based Void Fraction Measurement and Flow Regime Identification in Microchannel Flows Available to Purchase
Sidharth Paranjape,
Sidharth Paranjape
Purdue University, West Lafayette, IN
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Susan N. Ritchey,
Susan N. Ritchey
Purdue University, West Lafayette, IN
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Suresh V. Garimella
Suresh V. Garimella
Purdue University, West Lafayette, IN
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Sidharth Paranjape
Purdue University, West Lafayette, IN
Susan N. Ritchey
Purdue University, West Lafayette, IN
Suresh V. Garimella
Purdue University, West Lafayette, IN
Paper No:
IPACK2011-52116, pp. 193-202; 10 pages
Published Online:
February 14, 2012
Citation
Paranjape, S, Ritchey, SN, & Garimella, SV. "Impedance-Based Void Fraction Measurement and Flow Regime Identification in Microchannel Flows." Proceedings of the ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems. ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, MEMS and NEMS: Volume 2. Portland, Oregon, USA. July 6–8, 2011. pp. 193-202. ASME. https://doi.org/10.1115/IPACK2011-52116
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