Recently, the downsizing of car components becomes a big trend for the development of car electronics, and it is becoming very difficult to achieve the reliability results target without managing controlling the dispersion of the fatigue lives. The authors proposed an isothermal fatigue test method using small size solder joints to get the fatigue properties. The Manson-Coffin’s law given by this method could improve the correspondence between the simulation results and experimental results. Based upon the Manson-Coffin’s law and Miner’s law, the authors proposed a fatigue crack propagation simulation approach. Furthermore, in order to consider the heterogeneity of PCB due to the distribution of fiber network, the authors made heterogeneous model considering the distribution of the fiber. And the authors evaluated the fatigue life of solder joints in chip components with considering dispersion of the material properties by using the heterogeneous model.
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ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems
July 6–8, 2011
Portland, Oregon, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
978-0-7918-4461-8
PROCEEDINGS PAPER
Reliability Evaluation of Fatigue Life for Solder Joints in Chip Components Considering Dispersion of the Shape and the Properties Available to Purchase
Yuji Nishimura,
Yuji Nishimura
Yokohama National University, Yokohama, Japan
Search for other works by this author on:
Qiang Yu
Qiang Yu
Yokohama National University, Yokohama, Japan
Search for other works by this author on:
Yuji Nishimura
Yokohama National University, Yokohama, Japan
Qiang Yu
Yokohama National University, Yokohama, Japan
Paper No:
IPACK2011-52105, pp. 191-194; 4 pages
Published Online:
February 14, 2012
Citation
Nishimura, Y, & Yu, Q. "Reliability Evaluation of Fatigue Life for Solder Joints in Chip Components Considering Dispersion of the Shape and the Properties." Proceedings of the ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems. ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, MEMS and NEMS: Volume 1. Portland, Oregon, USA. July 6–8, 2011. pp. 191-194. ASME. https://doi.org/10.1115/IPACK2011-52105
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