The issue addressed in the present study is how to model wiring substrates to perform heat conduction analysis on moderate computational resource. Equivalent thermal conductivity is a convenient measure in thermal modeling. However, its notion needs re-examination where higher accuracy of heat conduction analysis is pursued. Proposed is a scheme where the indexed volumetric metal contents are used to estimate the equivalent conductivity of representative volume element (RVE). The index is designed to reflect the effect of metal pattern on heat flow through RVE. In order to illustrate the core concept we report the analysis performed on template models of high-density interconnect (HDI) substrates. The element of HDI contains copper in several forms; through-via, continuous plane, and cross wires. Five heat flow directions are assumed; two are linear and three are right-angled turn. From combinations of the metal pattern and the heat flow direction twenty five templates are created, then, they are subjected to detailed numerical analysis. The values of equivalent thermal conductivity derived from the numerical solutions reveal that the gross volumetric metal content is totally inadequate as a parameter of thermal characterization. The paper also outlines the overall organization of our analysis system which is being developed in an industry-academia cooperative effort under the auspices of JSME.

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