The high temperature reliability of flex-based Cu/tiecoat/polyimide structures was evaluated through finite element simulation and experimental approach. This study is part of an effort to characterize and optimize polyimide flex as a substrate material for electronics packages rated to greater than 204°C. The peel strength of several common adhesion metals (Ti, Cr, Ni, Cu) on Kapton E was quantified at room temperature and after high temperature storage in inert and highly oxidizing environments. These results were used in tandem with thermal-mechanical simulations to characterize the behavior of several tiecoat materials. Experimental results showed diminished peel strengths of both the Ti and Cr after a 100-hour 250°C heat treatment in air. However when annealed in an inert N2 environment at 250°C for 100 hours, Cr, Ni, and Ti retained their as-sputtered peel strength. Ni and Cu exhibited lower mechanical stresses in the simulation; however, their relatively low reactivity limits their adhesion strength at the interface in oxidizing environments. To further understand the origin of the thermal-mechanical stress, the effect of mismatched CTE was compared to mismatched elastic modulus. Both properties were found to contribute to stress generation; however elastic modulus mismatches had a much greater influence on the overall magnitude of the stress. Through experimentation and FEA analysis this study aims to develop a flexed-based high temperature packaging solution and to shed light onto high temperature tiecoat/polyimide interactions.

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