This paper describes a unique method of encapsulating MEMS switches at the wafer level using a thin-film “microshell” lid and a novel micro-embossing, or “stamping” technique to seal the lid. After fabrication of the MEMS switch and subsequent formation of the microshell, the switches are released through gold tunnels that allow the penetration of a chemical etchant. In a controlled ambient, a “stamp” wafer is aligned to the device wafer, and the wafers are thermally compressed together. This process applies pressure across each tunnel to fuse the gold, thereby sealing the microshell packages. By sealing and passivating the switches at the wafer level, the wafers can be exposed to backend processing, packaging, and assembly steps such as dicing without damaging the sensitive MEMS devices. Furthermore, the size, cost, and complexity of the packaged system are significantly reduced compared to standard wafer bonding processes.
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ASME 2007 InterPACK Conference collocated with the ASME/JSME 2007 Thermal Engineering Heat Transfer Summer Conference
July 8–12, 2007
Vancouver, British Columbia, Canada
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
0-7918-4277-0
PROCEEDINGS PAPER
A Stamp-Sealed Microshell Package for RF MEMS Switches
Valluri Rao
Valluri Rao
Intel Corporation
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John Heck
Intel Corporation
Hanan Bar
Intel Corporation
Tsung-Kuan A. Chou
Intel Corporation
Quan Tran
Intel Corporation
Qing Ma
Intel Corporation
Boaz Weinfeld
Intel Corporation
Valluri Rao
Intel Corporation
Paper No:
IPACK2007-33887, pp. 73-77; 5 pages
Published Online:
January 8, 2010
Citation
Heck, J, Bar, H, Chou, TA, Tran, Q, Ma, Q, Weinfeld, B, & Rao, V. "A Stamp-Sealed Microshell Package for RF MEMS Switches." Proceedings of the ASME 2007 InterPACK Conference collocated with the ASME/JSME 2007 Thermal Engineering Heat Transfer Summer Conference. ASME 2007 InterPACK Conference, Volume 1. Vancouver, British Columbia, Canada. July 8–12, 2007. pp. 73-77. ASME. https://doi.org/10.1115/IPACK2007-33887
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