The paper parametrically assesses the impact of the voids/delamination on the system thermal performance. Analysis are carried out numerically and validated against experimental data (thermal measurements and C-SAM images). Topics covered include the relationship between voids/delamination and TIMs’ and heat spreader’s effective thermal conductivity; sensitivity of the system thermal performance to void/delamination size and location; voids/delamination impact vs. on the chip power dissipation (uniform vs. non-uniform); comparison of TIM1 vs. TIM2 voids impact; and, finally, comparison of voids vs. delamination.
- Heat Transfer Division and Electronic and Photonic Packaging Division
Thermal Management of Voids and Delamination in TIMs
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Gektin, V. "Thermal Management of Voids and Delamination in TIMs." Proceedings of the ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference. Advances in Electronic Packaging, Parts A, B, and C. San Francisco, California, USA. July 17–22, 2005. pp. 641-645. ASME. https://doi.org/10.1115/IPACK2005-73446
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