In this study, we demonstrate a simple, full field displacement characterization technique based on digital image correlation (DIC). We develop a robust correlation measure implemented in a code and use it to characterize materials at high spatial and displacement resolution. We describe the methods implemented in the DIC code and compare against those available in the literature. We show how sample preparation may be entirely eliminated by using the natural speckle inherent in specular (rough) surfaces. We demonstrate further that the use of natural speckle enables very high spatial resolution (100 microns or less) since creating artificial speckle patterns in miscroscale spatial regions is a significant challenge. The software is also designed to be robust to varying contrasts between the deformed and the undeformed images. Its accuracy is enhanced by using NURBS (Non-Uniform Rational B-Spline) as the interpolating function in the code. We demonstrate the developed software and the underlying procedure on several packaging problems of interest. We measure the CTE of Alumina (Al2O3) using its natural speckle, we calculate the strain and therefore the modulus during mechanical testing of composite materials and we characterize the time dependent behavior of a micro-fiber reinforced composite (RT/Duroid) at high temperature.
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ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference
July 17–22, 2005
San Francisco, California, USA
Conference Sponsors:
- Heat Transfer Division and Electronic and Photonic Packaging Division
ISBN:
0-7918-4200-2
PROCEEDINGS PAPER
High Resolution Characterization of Materials Used in Packages Through Digital Image Correlation
V. Srinivasan,
V. Srinivasan
Purdue University, West Lafayette, IN
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S. Radhakrishnan,
S. Radhakrishnan
Purdue University, West Lafayette, IN
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G. Subbarayan,
G. Subbarayan
Purdue University, West Lafayette, IN
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T. Baughn,
T. Baughn
Raytheon Systems Corporation, Dallas, TX
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L. Nguyen
L. Nguyen
National Semiconductor Corporation, Santa Clara, CA
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V. Srinivasan
Purdue University, West Lafayette, IN
S. Radhakrishnan
Purdue University, West Lafayette, IN
X. Zhang
Purdue University, West Lafayette, IN
G. Subbarayan
Purdue University, West Lafayette, IN
T. Baughn
Raytheon Systems Corporation, Dallas, TX
L. Nguyen
National Semiconductor Corporation, Santa Clara, CA
Paper No:
IPACK2005-73258, pp. 1471-1478; 8 pages
Published Online:
March 4, 2009
Citation
Srinivasan, V, Radhakrishnan, S, Zhang, X, Subbarayan, G, Baughn, T, & Nguyen, L. "High Resolution Characterization of Materials Used in Packages Through Digital Image Correlation." Proceedings of the ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference. Advances in Electronic Packaging, Parts A, B, and C. San Francisco, California, USA. July 17–22, 2005. pp. 1471-1478. ASME. https://doi.org/10.1115/IPACK2005-73258
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