The effect of boundary conditions on heat transfer in rectangular microchannels is investigated. Of primary interest in this study is the influence of the boundary conditions on the temperature gradients in such geometries. The top of the microchannel under consideration is exposed to a uniform heat flux, which simulates the energy dissipated from electronic chips. Cooling fluid is allowed to flow through channels underneath the heat source. The physical configuration is subjected to various boundary conditions (e.g., first, second, and third kinds) and any combination of convection and radiation energy exchanges between the exposed surfaces and the external environment. The current configuration covers typical situations as found in most electronic cooling systems. The influences of the heat source strength, the external environment, and the aspect ratio are studied. The effects of varying these factors in a range typical of electronics thermal management applications are investigated. Temperature gradients along the fluid flow direction and their effect on the fluid resistance are presented.
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ASME 2003 International Electronic Packaging Technical Conference and Exhibition
July 6–11, 2003
Maui, Hawaii, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
0-7918-3690-8
PROCEEDINGS PAPER
Boundary Effect on Temperature Gradients in Microchannels
Patrick S. Cabral,
Patrick S. Cabral
The Aerospace Corporation, El Segundo, CA
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Tung T. Lam
Tung T. Lam
The Aerospace Corporation, El Segundo, CA
Search for other works by this author on:
Patrick S. Cabral
The Aerospace Corporation, El Segundo, CA
Tung T. Lam
The Aerospace Corporation, El Segundo, CA
Paper No:
IPACK2003-35190, pp. 401-409; 9 pages
Published Online:
January 5, 2009
Citation
Cabral, PS, & Lam, TT. "Boundary Effect on Temperature Gradients in Microchannels." Proceedings of the ASME 2003 International Electronic Packaging Technical Conference and Exhibition. 2003 International Electronic Packaging Technical Conference and Exhibition, Volume 2. Maui, Hawaii, USA. July 6–11, 2003. pp. 401-409. ASME. https://doi.org/10.1115/IPACK2003-35190
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