Numerical techniques have been used to evaluate various modifications to the design of a cooling system currently used for high power RF signal amplifiers. The system utilises a 300mm long × 220mm wide × 70mm high heat sink in forced turbulent air flows up to 120 litres per second. Using Computational Fluid Dynamics (CFD) software a detailed model of the heat sink, primary transistors and air flow was created. Experimental data obtained from the working system was used to validate the simulation results. The model was then modified to test the effects of various changes to the cooling system including incorporation of heat spreading techniques, elimination of bypass flow and changes to fin geometry. Reductions in transistor junction temperature of between 9°C and 12°C were predicted through the use of a copper heat spreader or full copper heat sink while the elimination of bypass flow reduced junction temperatures by up to 6°C. Strip fin and staggered fin arrangements provided little improvement, however by halving fin pitch and fin thickness (i.e doubling heat transfer area) device temperature reductions of 4°C were possible.
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ASME 2003 International Electronic Packaging Technical Conference and Exhibition
July 6–11, 2003
Maui, Hawaii, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
0-7918-3690-8
PROCEEDINGS PAPER
Numerical Evaluation of High Power Amplifier Heat Sink Design Options
Luke Maguire,
Luke Maguire
University of New South Wales, Sydney, Australia
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Masud Behnia,
Masud Behnia
University of New South Wales, Sydney, Australia
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Graham Morrison
Graham Morrison
University of New South Wales, Sydney, Australia
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Luke Maguire
University of New South Wales, Sydney, Australia
Masud Behnia
University of New South Wales, Sydney, Australia
Graham Morrison
University of New South Wales, Sydney, Australia
Paper No:
IPACK2003-35077, pp. 171-181; 11 pages
Published Online:
January 5, 2009
Citation
Maguire, L, Behnia, M, & Morrison, G. "Numerical Evaluation of High Power Amplifier Heat Sink Design Options." Proceedings of the ASME 2003 International Electronic Packaging Technical Conference and Exhibition. 2003 International Electronic Packaging Technical Conference and Exhibition, Volume 2. Maui, Hawaii, USA. July 6–11, 2003. pp. 171-181. ASME. https://doi.org/10.1115/IPACK2003-35077
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