The efficiency and reliability of the solid-state lighting devices strongly depend on successful thermal management. Light emitting diodes, LEDs, a strong candidate for the next generation general illumination applications are of interest. Typical white LEDs start with either blue or near UV light generated by the active quantum layers. The light is guided through a transparent encapsulant filled with micron sized phosphor particles. The phosphor particles up-convert the short wavelength light to desired colors, producing white light. Due to low quantum efficiency, during the conversion, localized heating of small particles occurs. Experimental results with high brightness LED packages showed that there is significant light output reduction. Idealized numerical models through Finite element technique were created to evaluate the effects of localized heat generations at particles and layers. Results showed that as small as a 3 mW heat generation on a 20 μm diameter spherical phosphor particle might lead to excessive temperatures which can be a major source of light output degradation and reliability concern for high brightness LEDs.
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ASME 2003 International Electronic Packaging Technical Conference and Exhibition
July 6–11, 2003
Maui, Hawaii, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
0-7918-3690-8
PROCEEDINGS PAPER
Effects of Localized Heat Generations Due to the Color Conversion in Phosphor Particles and Layers of High Brightness Light Emitting Diodes
Mehmet Arik,
Mehmet Arik
GE Global Research Center, Niskayuna, NY
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Stanton Weaver,
Stanton Weaver
GE Global Research Center, Niskayuna, NY
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Charles Becker,
Charles Becker
GE Global Research Center, Niskayuna, NY
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Michael Hsing,
Michael Hsing
General Electric Company, Valley View, OH
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Alok Srivastava
Alok Srivastava
GE Global Research Center, Niskayuna, NY
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Mehmet Arik
GE Global Research Center, Niskayuna, NY
Stanton Weaver
GE Global Research Center, Niskayuna, NY
Charles Becker
GE Global Research Center, Niskayuna, NY
Michael Hsing
General Electric Company, Valley View, OH
Alok Srivastava
GE Global Research Center, Niskayuna, NY
Paper No:
IPACK2003-35015, pp. 611-619; 9 pages
Published Online:
January 5, 2009
Citation
Arik, M, Weaver, S, Becker, C, Hsing, M, & Srivastava, A. "Effects of Localized Heat Generations Due to the Color Conversion in Phosphor Particles and Layers of High Brightness Light Emitting Diodes." Proceedings of the ASME 2003 International Electronic Packaging Technical Conference and Exhibition. 2003 International Electronic Packaging Technical Conference and Exhibition, Volume 1. Maui, Hawaii, USA. July 6–11, 2003. pp. 611-619. ASME. https://doi.org/10.1115/IPACK2003-35015
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