In the printed wiring board manufacturing sector, methods have been developed to improve the circuit packaging density. A problem has emerged in that the quality of drilled through hole is deteriorating in the smaller diameter drilling of printed wiring boards (PWBs) with high packaging density, because the insulation is insufficient among through-holes after plating in finer circuit pattern. Thus, we have attracted attention to occurrence of delamination in the glass cloth around the drilled hole of FR-4 type PWBs, because it is considered that the poor insulation among through holes is caused by ion migration along the delamination of glass cloth. In the drilling hole to GFRP, Damage occurs from the drilled hole wall to the inside of material by peeling off between layers, it is defined as delamination in this study. In the present report, we describe the influence of drilling conditions on the width of delamination of glass cloth around the drilled hole. First, we made the FR-4 type PWBs (thickness 0.2 mm) reinforced by five kinds of glass cloths. We carried out the drilling experiments (spindle speed 33000rpm and feed rate 0.01–0.06 mm/rev) for these PWBs with diameter 0.4 mm drill tools. Second, we researched the relationship between delamination width and relative hole position for the glass cloth thickness by image processing method. As a result, we demonstrate two important factors (the feed rate conditions in drilling and the thickness of glass cloth at drilled hole wall) to prevent the delamination of glass cloth. The practical formula is proposed to predict the delamination width around the drilled hole by a multivariate analysis method.
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ASME 2003 International Electronic Packaging Technical Conference and Exhibition
July 6–11, 2003
Maui, Hawaii, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
0-7918-3690-8
PROCEEDINGS PAPER
Through-Hole Drilling Condition of FR-4 Printed Wiring Boards Based on Preventing Ion Migration
Eiichi Aoyama,
Eiichi Aoyama
Doshisha University, Kyoutanabe, Kyoto, Japan
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Hiromichi Nobe,
Hiromichi Nobe
Doshisha University, Kyoutanabe, Kyoto, Japan
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Tadayuki Ikuta,
Tadayuki Ikuta
Doshisha University, Kyoutanabe, Kyoto, Japan
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Tsutao Katayama,
Tsutao Katayama
Doshisha University, Kyoutanabe, Kyoto, Japan
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Toshiki Hirogaki,
Toshiki Hirogaki
University of Shiga Prefecture, Hikone, Shiga, Japan
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Hisahiro Inoue,
Hisahiro Inoue
Aichi University of Technology, Gamagoori, Aichi, Japan
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Katsutoshi Yamauchi
Katsutoshi Yamauchi
Doshisha University, Kyoutanabe, Kyoto, Japan
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Eiichi Aoyama
Doshisha University, Kyoutanabe, Kyoto, Japan
Hiromichi Nobe
Doshisha University, Kyoutanabe, Kyoto, Japan
Tadayuki Ikuta
Doshisha University, Kyoutanabe, Kyoto, Japan
Tsutao Katayama
Doshisha University, Kyoutanabe, Kyoto, Japan
Toshiki Hirogaki
University of Shiga Prefecture, Hikone, Shiga, Japan
Hisahiro Inoue
Aichi University of Technology, Gamagoori, Aichi, Japan
Katsutoshi Yamauchi
Doshisha University, Kyoutanabe, Kyoto, Japan
Paper No:
IPACK2003-35083, pp. 53-59; 7 pages
Published Online:
January 5, 2009
Citation
Aoyama, E, Nobe, H, Ikuta, T, Katayama, T, Hirogaki, T, Inoue, H, & Yamauchi, K. "Through-Hole Drilling Condition of FR-4 Printed Wiring Boards Based on Preventing Ion Migration." Proceedings of the ASME 2003 International Electronic Packaging Technical Conference and Exhibition. 2003 International Electronic Packaging Technical Conference and Exhibition, Volume 1. Maui, Hawaii, USA. July 6–11, 2003. pp. 53-59. ASME. https://doi.org/10.1115/IPACK2003-35083
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