The lattice Boltzmann method (LBM) is used to examine multi-length scale, confined heat conduction problems in one dimension for which sub-continuum effects are important. This paper describes the implementation of the method and its application to electronic devices. A silicon-on-insulator device with internal heat generation is used as a case study to illustrate the advantages of the LBM. We compare our results with various hierarchical equations of heat transfer such as Fourier, Cattaneo, and Boltzmann transport equations, as well as with experimental and numerical data from the literature. Our results provide excellent agreement with other methodologies, at a far less computational effort.

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