A calibration technique is presented here that facilitates automated calibration of a robotic system used for open loop MEMS assembly. A micromechanical calibration device was fabricated in a 20 μm thick electro-plated nickel process as well as a 50 μm thick single crystal silicon, deep reactive ion etched (DRIE) process. This device uses a vision sensing system to detect end-effector position. Results obtained using the calibration device, are presented using a microgripper for pick and place assembly. The relative position of the microgripper and die-site was calibrated to an accuracy of ±1 μm using the described techniques. Microgripper geometry obtained using this technique is also ≤ 3.1 μm of the direct measurement. By utilizing these calibration techniques, the assembly system can be automated to yield a cost-effective microassembly solution.
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ASME 2003 International Electronic Packaging Technical Conference and Exhibition
July 6–11, 2003
Maui, Hawaii, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
0-7918-3690-8
PROCEEDINGS PAPER
Calibration Systems and Techniques for Automated Microassembly
A. Geisberger,
A. Geisberger
Zyvex Corporation, Richardson, TX
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G. Skidmore
G. Skidmore
Zyvex Corporation, Richardson, TX
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K. Tsui
Zyvex Corporation, Richardson, TX
A. Geisberger
Zyvex Corporation, Richardson, TX
M. Ellis
Zyvex Corporation, Richardson, TX
G. Skidmore
Zyvex Corporation, Richardson, TX
Paper No:
IPACK2003-35208, pp. 251-255; 5 pages
Published Online:
January 5, 2009
Citation
Tsui, K, Geisberger, A, Ellis, M, & Skidmore, G. "Calibration Systems and Techniques for Automated Microassembly." Proceedings of the ASME 2003 International Electronic Packaging Technical Conference and Exhibition. 2003 International Electronic Packaging Technical Conference and Exhibition, Volume 1. Maui, Hawaii, USA. July 6–11, 2003. pp. 251-255. ASME. https://doi.org/10.1115/IPACK2003-35208
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