Apodization of amplitude and phase at the entrance pupil of an optical system is able to have advantages on optical resolution and focal depth. As an optical system for the electro-photography continuously requires highly resolved dot image and extended focal length to obtain more delicate expression with adequate production stability. Advantages from apodization technique can improve system performance and supply high degree of reliability of the optical system. In this study, theoretical apodization characteristics in a laser scanning optical system for electro-photography is firstly analyzed in the aspects of enhancement of optical resolution and focal depth with the proposed method of apodization. In addition, fundamental experimental result on measurement of beam spot size is reported to support theoretical results.
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ASME 2016 Conference on Information Storage and Processing Systems
June 20–21, 2016
Santa Clara, California, USA
Conference Sponsors:
- Information Storage and Processing Systems Division
ISBN:
978-0-7918-4988-0
PROCEEDINGS PAPER
Analysis on Resolution Enhancement by Optical Pupil Apodization in a Laser Scanning Printing System
Wan-chin Kim,
Wan-chin Kim
Samsung Electronics Co. Ltd, Suwon, Republic of Korea
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Sang-Koo Han,
Sang-Koo Han
Samsung Electronics Co. Ltd, Suwon, Republic of Korea
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Sung-Dae Kim
Sung-Dae Kim
Samsung Electronics Co. Ltd, Suwon, Republic of Korea
Search for other works by this author on:
Wan-chin Kim
Samsung Electronics Co. Ltd, Suwon, Republic of Korea
Sang-Koo Han
Samsung Electronics Co. Ltd, Suwon, Republic of Korea
Sung-Dae Kim
Samsung Electronics Co. Ltd, Suwon, Republic of Korea
Paper No:
ISPS2016-9526, V001T06A001; 4 pages
Published Online:
September 23, 2016
Citation
Kim, W, Han, S, & Kim, S. "Analysis on Resolution Enhancement by Optical Pupil Apodization in a Laser Scanning Printing System." Proceedings of the ASME 2016 Conference on Information Storage and Processing Systems. ASME 2016 Conference on Information Storage and Processing Systems. Santa Clara, California, USA. June 20–21, 2016. V001T06A001. ASME. https://doi.org/10.1115/ISPS2016-9526
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