The method discussed in this paper uses a simple and concise procedure, which is effective and reliable for locating tip-diffracted signals. The technique utilizes refracted longitudinal waves to both detect and size planar flaws.

Confusing signals which are traditionally associated with angled L-wave techniques, due to mode conversion and direct shear wave reflections, are significantly reduced, while enhancing the ability to detect tip signals by using the FAST™ technique. This technique increases the speed of detection and simplifies sizing compared to traditional shear wave examinations and/or other advanced techniques. FAST™ is an acronym for Flaw Analysis and Sizing Technique.

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