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Keywords: DEP (dielectrophorises)Close
Proc. ASME. IMECE2006, Microelectromechanical Systems, 547-550, November 5–10, 2006
Paper No: IMECE2006-15545
...) measurement of 15 nm gold particles and DNA molecules, we showed that the CNT tip modified by FIB produced high resolution images as well as little wear by comparing with those of a conventional silicon tip Key Words : CNT (carbon nanotube), DEP (dielectrophorises), FIB (focus ion beam), AFM tip(atomic force...