1-1 of 1
Keywords: DEP (dielectrophorises)
Close
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Proceedings Papers

Proc. ASME. IMECE2006, Microelectromechanical Systems, 547-550, November 5–10, 2006
Paper No: IMECE2006-15545
...) measurement of 15 nm gold particles and DNA molecules, we showed that the CNT tip modified by FIB produced high resolution images as well as little wear by comparing with those of a conventional silicon tip Key Words : CNT (carbon nanotube), DEP (dielectrophorises), FIB (focus ion beam), AFM tip(atomic force...