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Keywords: AFM
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Proceedings Papers

Proc. ASME. IMECE2021, Volume 12: Mechanics of Solids, Structures, and Fluids; Micro- and Nano- Systems Engineering and Packaging, V012T12A046, November 1–5, 2021
Paper No: IMECE2021-70600
... thickness and properties. The symmetric composite laminate plates have a thickness of ∼8mm. Specimens from the subsurface (∼400 μm from the surface) and the depth (∼ 4mm from the surface) were considered. The polymer matrix composite samples have been exposed to heat and humidity. AFM Multimode 8, scanner...
Proceedings Papers

Proc. ASME. IMECE2013, Volume 2B: Advanced Manufacturing, V02BT02A033, November 15–21, 2013
Paper No: IMECE2013-65674
... 1 Copyright © 2013 by ASME INFLUENCES OF SILICON CRYSTAL ANISOTROPY IN NANO-MACHINING PROCESSES USING AFM Yachao Wang Department of Industrial & Manufacturing Engineering North Dakota State University Fargo, North Dakota, USA Jing Shi Department of Industrial & Manufacturing Engineering North...
Proceedings Papers

Proc. ASME. IMECE2012, Volume 3: Design, Materials and Manufacturing, Parts A, B, and C, 2117-2124, November 9–15, 2012
Paper No: IMECE2012-89644
... is measured by Atomic Force Microscope (AFM) is thoroughly investigated. First, micro laser dimples of different diameters' (D's) of 5, 10 and 20 µm are fabricated on air hardened tool steel samples using High quality high power CuBr vapour laser. The distance (L), between the centers of two neighbouring...
Proceedings Papers

Proc. ASME. IMECE2011, Volume 10: Heat and Mass Transport Processes, Parts A and B, 613-617, November 11–17, 2011
Paper No: IMECE2011-64357
... to conduct because of how small its scale. In the present work the accurate geometry of the region near the three-phase contact line was obtained by directly scanning the thin-film region with atomic force microscopy (AFM). The contact angles were directly extracted from the results and compared...
Proceedings Papers

Proc. ASME. IMECE2002, Microelectromechanical Systems, 103-109, November 17–22, 2002
Paper No: IMECE2002-33291
... 23 05 2008 The design and microfabrication of silicon co-axial evanescent microwave probes (EMP) compatible with atomic force microscope (AFM) imaging was discussed. Scanning EMP (SEMP) imaging is suitable for nondestructive surface and subsurface characterization of materials over...
Proceedings Papers

Proc. ASME. IMECE2003, Microelectromechanical Systems, 629-636, November 15–21, 2003
Paper No: IMECE2003-41762
... 14 05 2008 When an Atomic Force Microscope (AFM) is operated in air, capillary condensation induces meniscus formation between the AFM tip and substrate. At present, no models account for the temperature-dependence of meniscus formation. This paper describes experiments measuring...
Proceedings Papers

Proc. ASME. IMECE2005, Design Engineering, Parts A and B, 443-452, November 5–11, 2005
Paper No: IMECE2005-80007
... and second bending modes and the first torsional mode. Different cantilever geometries are also investigated. The results expose the physics of dissipation in the surrounding fluid and are expected to be of immediate interest to the Atomic Force Microscopy (AFM) and microcantilever biosensor communities...