Excimer laser ablation of thin films finds an advanced application in the manufacture of integrated circuits and it is desirable in the process that the size of the ablated region is close to the design and clean ablation takes place at the edges. In practice, the boundaries of the ablated region are irregular, the features are oversized and spattering is observed inside the ablated region. This work studies the edge roughness, channel width and boundary integrity as indicators of quality of ablation. Experiments are conducted with varying fluence, shot overlap and pitch (inter-channel distance) to generate different features. The edge roughness and channel width are found to have little dependence on spot overlap but are greatly influenced by the fluence. The overcut (channel width) is more at higher fluence but repetitive pulses do not affect the overcut. The range of parameters of ablation are identified from these experiments that lead to optimum edge roughness, channel width and boundary integrity.
Skip Nav Destination
ASME 2013 International Mechanical Engineering Congress and Exposition
November 15–21, 2013
San Diego, California, USA
Conference Sponsors:
- ASME
ISBN:
978-0-7918-5639-0
PROCEEDINGS PAPER
Microfeature Edge Quality Optimization in Excimer Laser Ablation of Metallic Film
Syed Nadeem Akhtar,
Syed Nadeem Akhtar
Indian Institute of Technology Kanpur, Kanpur, India
Search for other works by this author on:
J. Ramkumar,
J. Ramkumar
Indian Institute of Technology Kanpur, Kanpur, India
Search for other works by this author on:
S. Anantha Ramakrishna
S. Anantha Ramakrishna
Indian Institute of Technology Kanpur, Kanpur, India
Search for other works by this author on:
Syed Nadeem Akhtar
Indian Institute of Technology Kanpur, Kanpur, India
J. Ramkumar
Indian Institute of Technology Kanpur, Kanpur, India
S. Anantha Ramakrishna
Indian Institute of Technology Kanpur, Kanpur, India
Paper No:
IMECE2013-64149, V010T11A038; 6 pages
Published Online:
April 2, 2014
Citation
Akhtar, SN, Ramkumar, J, & Ramakrishna, SA. "Microfeature Edge Quality Optimization in Excimer Laser Ablation of Metallic Film." Proceedings of the ASME 2013 International Mechanical Engineering Congress and Exposition. Volume 10: Micro- and Nano-Systems Engineering and Packaging. San Diego, California, USA. November 15–21, 2013. V010T11A038. ASME. https://doi.org/10.1115/IMECE2013-64149
Download citation file:
12
Views
Related Proceedings Papers
Related Articles
Heat Transfer and Phase Transformations in Laser Annealing of Thin Si Films
J. Heat Transfer (April,2002)
ArF Excimer Laser Micromachining of MEMS Materials: Characterization and Applications
J. Micro Nano-Manuf (June,2014)
Modeling of Thin-Film Single and Multilayer Nanosecond Pulsed Laser Processing
J. Manuf. Sci. Eng (December,2013)
Related Chapters
RISP Configuration Overhead Optimization Using an Efficient Configuration Unit
International Conference on Advanced Computer Theory and Engineering (ICACTE 2009)
Multiple-Shot Laser Damage Thresholds of Ultraviolet Reflectors at 248 and 308 Nanometers
Laser Induced Damage In Optical Materials: 1980
Optical Characterization of Low-Scatter, Plasma-Deposited Thin Films
Laser Induced Damage In Optical Materials: 1983