Amorphous InGaZnO (a-IGZO) thin film transistors (TFTs) are high performance transparent oxide semiconductors (TOS) that are attractive alternatives to poly-Si TFTs, because they provide better uniformity in terms of device characteristics, such as the threshold voltage and mobility. However, the electrical performance of flexible TFTs should have mechanical robustness against substrate bending and stretching without resultant changes. In this regard, many researchers have focused on improving mechanical stability as well as electrical performance of TFTs, such as elasticity and durability under artificial conditions. In this paper, the mechanical characteristics of an a-IGZO based inverters were numerically investigated. The results were graphically depicted when the device was bent by a total of 10% of its length in the x-axis. The mechanical properties of IGZO were assumed to be similar with the zinc oxide (ZnO).
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ASME 2012 International Mechanical Engineering Congress and Exposition
November 9–15, 2012
Houston, Texas, USA
Conference Sponsors:
- ASME
ISBN:
978-0-7918-4525-7
PROCEEDINGS PAPER
A Study on the Mechanical Stability of a-IGZO Based Inverter
Byung-Jae Kim,
Byung-Jae Kim
Sungkyunkwan University, Suwon, Korea
Search for other works by this author on:
Youn-Jea Kim
Youn-Jea Kim
Sungkyunkwan University, Suwon, Korea
Search for other works by this author on:
Byung-Jae Kim
Sungkyunkwan University, Suwon, Korea
Youn-Jea Kim
Sungkyunkwan University, Suwon, Korea
Paper No:
IMECE2012-87293, pp. 745-748; 4 pages
Published Online:
October 8, 2013
Citation
Kim, B, & Kim, Y. "A Study on the Mechanical Stability of a-IGZO Based Inverter." Proceedings of the ASME 2012 International Mechanical Engineering Congress and Exposition. Volume 9: Micro- and Nano-Systems Engineering and Packaging, Parts A and B. Houston, Texas, USA. November 9–15, 2012. pp. 745-748. ASME. https://doi.org/10.1115/IMECE2012-87293
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