Understanding the structure near the three-phase contact line is critical for a comprehensive understanding of the thin-film region when a liquid partially wets a planer substrate. Despite numerous theoretical and simulation efforts found literature, an accurate experiment is difficult to conduct because of how small its scale. In the present work the accurate geometry of the region near the three-phase contact line was obtained by directly scanning the thin-film region with atomic force microscopy (AFM). The contact angles were directly extracted from the results and compared with the ones measured from traditional optical methods.

This content is only available via PDF.
You do not currently have access to this content.