Xurography is a novel manufacturing process for microfluidic systems, providing rapid prototyping capability at low cost compared to traditional microfabrication technologies. An experimental study of flow characteristics in rectangular xurographic microchannels is reported. Mean microchannel depth, defined by the thickness of the double-sided adhesive kapton tape that forms the channel pattern, is 105–110 μm. The microchannels are capped with glass and mechanically reinforced to withstand the high operating pressures that accompany high Reynolds number Re flow (250–3500). Channel aspect ratios range from 0.45 to 0.074. Width and length measurements are performed using optical microscopy. Microchannel height is measured using a unique nondestructive laser interferometry technique, capable of accurate measurement of the enclosed, compressed microchannels. Data are reported for friction factor, critical Reynolds number, and minor losses in expansions, contractions, and 90° miter bends. Expansion and contraction area ratios are 2, 3, and 5. The experimental Poissuille number in laminar flow for all aspect ratios is in good agreement with theoretical values. Critical Reynolds number ranges from 1800 to 2300, and is found to be dependent on channel defects, such as adhesive droplets and edge imperfections, inherent to xurography. Expansion and contraction losses decrease gradually with increasing Re in the range 250–4000 and increase for decreasing area ratio. Loss coefficients in the 90° miter bends increase with modified aspect ratio and are nearly invariant for 1200 < Re < 2100. Loss coefficients increase nearly linearly with Re for Re < 1200 and decrease significantly for Re greater than the critical Reynolds number.
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ASME 2010 International Mechanical Engineering Congress and Exposition
November 12–18, 2010
Vancouver, British Columbia, Canada
Conference Sponsors:
- ASME
ISBN:
978-0-7918-4447-2
PROCEEDINGS PAPER
Minor Losses in Rectangular Xurographic Microchannels
Daniel Torgerson,
Daniel Torgerson
University of Utah, Salt Lake City, UT
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Rahul Kolekar,
Rahul Kolekar
University of Utah, Salt Lake City, UT
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Bruce Gale,
Bruce Gale
University of Utah, Salt Lake City, UT
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Tim Ameel
Tim Ameel
University of Utah, Salt Lake City, UT
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Daniel Torgerson
University of Utah, Salt Lake City, UT
Rahul Kolekar
University of Utah, Salt Lake City, UT
Bruce Gale
University of Utah, Salt Lake City, UT
Tim Ameel
University of Utah, Salt Lake City, UT
Paper No:
IMECE2010-39401, pp. 453-462; 10 pages
Published Online:
April 30, 2012
Citation
Torgerson, D, Kolekar, R, Gale, B, & Ameel, T. "Minor Losses in Rectangular Xurographic Microchannels." Proceedings of the ASME 2010 International Mechanical Engineering Congress and Exposition. Volume 10: Micro and Nano Systems. Vancouver, British Columbia, Canada. November 12–18, 2010. pp. 453-462. ASME. https://doi.org/10.1115/IMECE2010-39401
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