Decomposed hydrogen peroxide (H2O2) contains excess moisture and stabilizers that can deteriorate SOFC performance and durability markedly in the cathode. A numerical study is performed for a strontium-doped lanthanum manganate and yttria stabilized zirconia (LSM-YSZ) composite cathode using an oxidant stream consisting of a 20% O2 and 80% H2O mixture to study the detailed reaction mechanism and local transport and polarization phenomena. Specifically the 1-D cathode model couples multi-component gas and charge transport with an oxygen reduction mechanism. The model is validated with data from the literature and used to study the transport effect only of H2O in the cathode. Future work will consider the effect of H2O on the electrochemical reaction mechanism.
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ASME 2008 International Mechanical Engineering Congress and Exposition
October 31–November 6, 2008
Boston, Massachusetts, USA
Conference Sponsors:
- ASME
ISBN:
978-0-7918-4869-2
PROCEEDINGS PAPER
Strontium-Doped Lanthanum Manganate Cathode Degradation Due to a Decomposed Hydrogen Peroxide Oxidant Feed Stream
John R. Izzo, Jr.,
John R. Izzo, Jr.
University of Connecticut, Storrs, CT
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Kyle N. Grew,
Kyle N. Grew
University of Connecticut, Storrs, CT
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Wilson K. S. Chiu
Wilson K. S. Chiu
University of Connecticut, Storrs, CT
Search for other works by this author on:
John R. Izzo, Jr.
University of Connecticut, Storrs, CT
Kyle N. Grew
University of Connecticut, Storrs, CT
Wilson K. S. Chiu
University of Connecticut, Storrs, CT
Paper No:
IMECE2008-68424, pp. 403-406; 4 pages
Published Online:
August 26, 2009
Citation
Izzo, JR, Jr., Grew, KN, & Chiu, WKS. "Strontium-Doped Lanthanum Manganate Cathode Degradation Due to a Decomposed Hydrogen Peroxide Oxidant Feed Stream." Proceedings of the ASME 2008 International Mechanical Engineering Congress and Exposition. Volume 8: Energy Systems: Analysis, Thermodynamics and Sustainability; Sustainable Products and Processes. Boston, Massachusetts, USA. October 31–November 6, 2008. pp. 403-406. ASME. https://doi.org/10.1115/IMECE2008-68424
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