A new real-time moire´ interferometry system based on conductive heating and cooling is introduced. A special chamber is designed and fabricated using a high power thermoelectric cooler, which is connected to the compact moire´ interferometer to form the system. Compared with the conventional convection-based system, the proposed system provides a higher ramp rate while improving the temperature response to control signals. The system is applied to investigate the creep behavior of a eutectic solder material. A new solder joint configuration is designed and fabricated to produce a virtually uniform shear strain field. The deformation of solder joint is documented at a controlled ramp rate over several thermal cycles. The experimental results are analyzed and compared with those of finite element analyses to investigate the validity of solder constitutive models available in the literatures.
Skip Nav Destination
ASME 2007 International Mechanical Engineering Congress and Exposition
November 11–15, 2007
Seattle, Washington, USA
Conference Sponsors:
- ASME
ISBN:
0-7918-4304-1
PROCEEDINGS PAPER
An Advanced Real-Time Moire´ Interferometry System With Conductive Heating/Cooling and Its Application on a Creep Behavior of Solder
Seungmin Cho,
Seungmin Cho
Samsung Techwin Company, Ltd., Yongin, Gyunggi, South Korea
Search for other works by this author on:
Changsoo Jang,
Changsoo Jang
University of Maryland, College Park, MD
Search for other works by this author on:
Bongtae Han
Bongtae Han
University of Maryland, College Park, MD
Search for other works by this author on:
Seungmin Cho
Samsung Techwin Company, Ltd., Yongin, Gyunggi, South Korea
Changsoo Jang
University of Maryland, College Park, MD
Bongtae Han
University of Maryland, College Park, MD
Paper No:
IMECE2007-43698, pp. 479-487; 9 pages
Published Online:
May 22, 2009
Citation
Cho, S, Jang, C, & Han, B. "An Advanced Real-Time Moire´ Interferometry System With Conductive Heating/Cooling and Its Application on a Creep Behavior of Solder." Proceedings of the ASME 2007 International Mechanical Engineering Congress and Exposition. Volume 10: Mechanics of Solids and Structures, Parts A and B. Seattle, Washington, USA. November 11–15, 2007. pp. 479-487. ASME. https://doi.org/10.1115/IMECE2007-43698
Download citation file:
8
Views
Related Proceedings Papers
Related Articles
Measurement of Creep and Relaxation Behaviors of Wafer-Level CSP Assembly Using Moire´ Interferometry
J. Electron. Packag (June,2003)
Development of the Damage State Variable for a Unified Creep Plasticity Damage Constitutive Model of the 95.5Sn–3.9Ag–0.6Cu Lead-Free Solder
J. Electron. Packag (March,2008)
Reliability Modeling of Lead-Free Solder Joints in Wafer-Level Chip Scale Packages
J. Electron. Packag (March,2010)
Related Chapters
Thermoelectric Coolers
Thermal Management of Microelectronic Equipment
Analysis of Components: Strain- and Deformation-Controlled Limits
Design & Analysis of ASME Boiler and Pressure Vessel Components in the Creep Range
Thermodynamic Performance
Closed-Cycle Gas Turbines: Operating Experience and Future Potential