Analysis on the Effect of Input Impact Profiles in Drop Test Available to Purchase

The objective of this paper is to develop an analytical or mathematical predicative model for the evaluation of dynamic response of a structural element in a microelectronic or an optoelectronic product to an impact load occurring as a result of drop or shock test. Closed-form theoretical solution was obtained to simulate the board level drop test. The block diagram based SIMULINK analysis was introduced to determine the response with various impact configurations for the system level drop test as well. This study will help reliability engineers to design the impact input profiles and obtain the desired responses, and to calibrate and validate finite element analysis results quickly for both board level and system level drop test. It was found that time durations of the input profiles play an important role in the dynamic response. The system response can be designed by carefully choosing the impact time duration. Certain input pulse time results in the response with very low ringing after first or second peaks.