This paper presents detailed results on noise modeling and experimental characterization applicable to piezoresistive MEMS transducers using a piezoresistive MEMS microphone as an example. To accurately model the lower limit of the dynamic range of piezoresistive MEMS transducers, a detailed noise equivalent circuit, piezoresistor noise model, and experimental noise measurements are needed. From the sensitivity and the total root-mean-square output noise, the minimum detectable signal (MDS) may be computed. Key experimental results include comparison of the DC bridge and AC bridge noise measurement techniques and use of the AC measurement technique when the piezoresistive transducer output noise is less than the low frequency DC setup noise.
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ASME 2006 International Mechanical Engineering Congress and
Exposition
November 5–10, 2006
Chicago, Illinois, USA
Conference Sponsors:
- Microelectromechanical Systems Division
ISBN:
0-7918-4775-6
PROCEEDINGS PAPER
Noise Modeling and Characterization of Piezoresistive Transducers Available to Purchase
Toshikazu Nishida,
Toshikazu Nishida
University of Florida
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Gijs Bosman
Gijs Bosman
University of Florida
Search for other works by this author on:
Toshikazu Nishida
University of Florida
Robert Dieme
University of Florida
Mark Sheplak
University of Florida
Gijs Bosman
University of Florida
Paper No:
IMECE2006-15392, pp. 695-700; 6 pages
Published Online:
December 14, 2007
Citation
Nishida, T, Dieme, R, Sheplak, M, & Bosman, G. "Noise Modeling and Characterization of Piezoresistive Transducers." Proceedings of the ASME 2006 International Mechanical Engineering Congress and Exposition. Microelectromechanical Systems. Chicago, Illinois, USA. November 5–10, 2006. pp. 695-700. ASME. https://doi.org/10.1115/IMECE2006-15392
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