Gold nanowires were patterned with e-beam lithography and fabricated with a gold film deposited by e-beam evaporation. Carbon and oxygen contaminants were found to be present mostly on the gold surface with x-ray photoelectron spectroscopy. Slight carbon contamination was indicated through the film thickness. Dimensions of the nanowires were measured with scanning electron microscopy, and the resistance of the wires was measured with a 2-probe stage at a low vacuum. Non-linear current-voltage curves were obtained, which was attributed to Joule heating. Further analysis, by restricting the bias voltage in a small range and negligible Joule heating, suggests that surface contamination can significantly affect the resistivity measurements of gold nanowires.
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ASME 2006 International Mechanical Engineering Congress and
Exposition
November 5–10, 2006
Chicago, Illinois, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
0-7918-4769-1
PROCEEDINGS PAPER
Contamination Effect on the Electrical Resistivity of Gold Nanowires
C. M. Lilley,
C. M. Lilley
University of Illinois at Chicago
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K. M. Paing
K. M. Paing
University of Illinois at Chicago
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Q. Huang
University of Illinois at Chicago
C. M. Lilley
University of Illinois at Chicago
K. M. Paing
University of Illinois at Chicago
Paper No:
IMECE2006-13750, pp. 183-187; 5 pages
Published Online:
December 14, 2007
Citation
Huang, Q, Lilley, CM, & Paing, KM. "Contamination Effect on the Electrical Resistivity of Gold Nanowires." Proceedings of the ASME 2006 International Mechanical Engineering Congress and Exposition. Electronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology. Chicago, Illinois, USA. November 5–10, 2006. pp. 183-187. ASME. https://doi.org/10.1115/IMECE2006-13750
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