Experiments have shown that a thin polymer film subjected to an electrostatic field may lose stability at the polymer-air interface, leading to uniform self-organized pillars emerging out of the film surface. This paper presents a three dimensional model to account for this behavior. Attention is focused on a fully nonlinear evolution simulation to reveal the dynamic process from an early perturbation to late structure formation. Energetic components involving the interface energy and dielectric effect, and kinetics of coupled viscous flow and diffusion are incorporated into a phase field framework. The semi-implicit Fourier spectral method and preconditioned biconjugate-gradient method are applied for high efficiency and numerical stability. The simulations reveal rich dynamics of the pattern formation process, and show that the kinetic constraint of the substrate can essentially limit structure coarsening. The pillar size is insensitive to the film thickness while the distance between pillars and the growth rate are significantly affected. The study also suggests an approach to control structural formation in thin films with a designed electric field.
Skip Nav Destination
Close
Sign In or Register for Account
ASME 2006 International Mechanical Engineering Congress and Exposition
November 5–10, 2006
Chicago, Illinois, USA
Conference Sponsors:
- Applied Mechanics Division
ISBN:
0-7918-4766-7
PROCEEDINGS PAPER
Interface Instability and Morphology Evolution of Thin Films Induced by Electrostatic Interaction
Wei Lu
Wei Lu
University of Michigan
Search for other works by this author on:
Dongchoul Kim
University of Michigan
Wei Lu
University of Michigan
Paper No:
IMECE2006-14954, pp. 531-536; 6 pages
Published Online:
December 14, 2007
Citation
Kim, D, & Lu, W. "Interface Instability and Morphology Evolution of Thin Films Induced by Electrostatic Interaction." Proceedings of the ASME 2006 International Mechanical Engineering Congress and Exposition. Applied Mechanics. Chicago, Illinois, USA. November 5–10, 2006. pp. 531-536. ASME. https://doi.org/10.1115/IMECE2006-14954
Download citation file:
- Ris (Zotero)
- Reference Manager
- EasyBib
- Bookends
- Mendeley
- Papers
- EndNote
- RefWorks
- BibTex
- ProCite
- Medlars
Close
Sign In
3
Views
0
Citations
Related Proceedings Papers
Related Articles
A New Kind of Science
Appl. Mech. Rev (March,2003)
Laser-Induced Deformation Patterns in Thin Films and Surfaces
J. Eng. Mater. Technol (April,1999)
Related Chapters
Transient Temperature and Heat Flux Measurement Using Thin-Film Microsensors
Ultrasonic Welding of Lithium-Ion Batteries
Characteristics of Nitrogen-Doped Antimony Telluride Thin Films for Phase-Change Random Access Memory
International Conference on Mechanical and Electrical Technology, 3rd, (ICMET-China 2011), Volumes 1–3
Structural and Optical Properties of Nanostructured Bismuth Sulfide — Lead Sulfide thin Films of Variable Compositions
International Conference on Mechanical and Electrical Technology, 3rd, (ICMET-China 2011), Volumes 1–3