Ultrasonic guided waves inspection using Lamb waves is suitable for damage detection in metallic structures. This paper will present experimental results obtained using guided Lamb waves to detect flaws in aluminum specimens with design features applicable to space applications. Two aluminum panels were fabricated from a variable-thickness aluminum top plate, with two bolted I-beams edge stiffeners and four bonded angle stiffeners. Artificial damages were introduced in the two panels: cracks, corrosions, and disbonds. The proposed investigation methods used embedded piezoelectric wafer active sensors (PWAS) to excite and receive Lamb waves. Three wave propagation methods were used: pitch-catch, pulse-echo, and the embedded ultrasonic structural radar (EUSR). In addition, we also used a standing-wave damage detection technique, the electro-mechanical impedance method. The paper will present in detail the salient results from using these methods for damage detection and structural health monitoring. Where appropriate, comparison between different methods in detecting the same damage will be performed. The results have demonstrated the ability of piezoelectric wafer active sensors working in conjunction with guided Lamb waves to detect various types of damages present in complex geometry structures typical of space applications.
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ASME 2005 International Mechanical Engineering Congress and Exposition
November 5–11, 2005
Orlando, Florida, USA
Conference Sponsors:
- Nondestructive Evaluation Engineering Division
ISBN:
0-7918-4226-6
PROCEEDINGS PAPER
Non-Destructive Evaluation (NDE) of Space Application Panels Using Piezoelectric Wafer Active Sensors
Victor Giurgiutiu,
Victor Giurgiutiu
University of South Carolina
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Shiv Joshi
Shiv Joshi
NextGen Aeronautics
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Adrian Cuc
University of South Carolina
Zeb Tidwell
NextGen Aeronautics, Inc.
Victor Giurgiutiu
University of South Carolina
Shiv Joshi
NextGen Aeronautics
Paper No:
IMECE2005-81721, pp. 85-94; 10 pages
Published Online:
February 5, 2008
Citation
Cuc, A, Tidwell, Z, Giurgiutiu, V, & Joshi, S. "Non-Destructive Evaluation (NDE) of Space Application Panels Using Piezoelectric Wafer Active Sensors." Proceedings of the ASME 2005 International Mechanical Engineering Congress and Exposition. Nondestructive Evaluation Engineering. Orlando, Florida, USA. November 5–11, 2005. pp. 85-94. ASME. https://doi.org/10.1115/IMECE2005-81721
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