In this paper, we investigated the effect of the film thickness on heat transfer and subsequent film temperature distribution of an optical fiber as it traverses through a chemical vapor deposition (CVD) reactor. A 50 nm thick carbon coating is applied on the optical fiber as it moves through the CVD reactor. In this process, the only heat source is the hot optical fiber entering the CVD reactor from the draw furnace. Radiation heat transfer from the optical fiber as it is being coated plays an important role during CVD carbon film growth. The carbon film will change the effective emissivity of the optical fiber as it traverses through the CVD reactor. This study will calculate the effective emissivity of this film-fiber structure based on wave theory, and evaluate the optical fiber’s resulting temperature field and rate of heat transfer loss during chemical vapor deposition. Results are correlated to operating conditions.

1.
E. Lindholm, J. Li, A. S. Hokansson, and J. Abramczyk, 1999, “Low Speed Carbon Deposition Process for Hermetic Optical Fibers,” Proc. 48th Int. Wire Cable Symp. (IWCS), pp. 672–679.
2.
Koguchi
 
M.
,
1993
, “
Microstructure of Carbon Layers Deposited on Optical Fibers and Hydrogen Diffusion in the Layers
,”
J. Ceramic Soc. Japan, Int. Ed.
, vol.
101
, no.
3
, pp.
293
296
.
3.
Verbrugge
 
V.
,
1993
, “
Carbon Coatings on Optical Fibers by PECVD
,”
J. Physique
, vol.
3
, no.
7
, pt. 2, pp.
1377
1382
.
4.
Iwanik
 
P. O.
and
Chiu
 
W. K. S.
,
2003
, “
Temperature Distribution of an Optical Fiber Traversing Through a Chemical Vapor Deposition Reactor
,”
Numerical Heat Transfer Part A: Applications
, vol.
43
, pp.
221
237
.
5.
W. Huang and W. K. S. Chiu, 2005, “Heat and Mass Transfer in a CVD Optical Fiber Coating Process by Propane Precursor Gas,” Proc. 2005 ASME Summer Heat Transfer Conference, CD-ROM Paper #HT2005-72518.
6.
Han
 
J.
and
Jensen
 
K. F.
,
1993
, “
Combined Experimental and Modeling Studies of Laser-Assisted Chemical Vapor Deposition of Copper from Copper(I)-Hexafluoracetylacetonate Trimethylvinylsilane
,”
Journal of Applied Physics
, vol.
75
, no.
4
, pp.
2240
2250
.
7.
Pigeat
 
P.
,
Rouxel
 
D.
and
Weber
 
B.
,
1997
, “
Calculation of Thermal Emissivity for Thin Films by a Direct Method
,”
Physics Review B
, vol.
57
, pp.
9293
9300
.
8.
Pei
 
J.
,
Degertekin
 
F. L.
,
Khuri-Yakub
 
B. T.
and
Saraswat
 
K. C.
,
1995
, “
In Situ Thin Film Thickness Measurement with Acoustic Lamp Waves
,”
Applied Physics Letters
, vol.
66
, no.
17
, pp.
2177
2179
.
9.
Lee
 
C. H.
and
Tseng
 
S. Y.
,
1998
, “
In Situ Fixed-Angle Xray Reflectivity Measurement of Thin Film Roughness and Thickness during Deposition
,”
Journal of Applied Crystallography
, vol.
31
, pp.
181
184
.
10.
W. Tian, W. Huang and W. K. S. Chiu, 2005, “Hemispherical Emittance of a Semitransparent Fiber Coated with a Submicron Absorbing Film,” Proc. 2005 ASME Summer Heat Transfer Conference, CD-ROM Paper # HT2005-72519.
11.
Myers
 
M. R.
,
1989
, “
A Model for Unsteady Analysis of Preform Drawing
,”
AIChE Journal
, vol.
35
, pp.
592
602
.
12.
E. D. Palik, 1998, Handbook of Optical Constants of Solids, Academic Press, San Diego, CA.
This content is only available via PDF.
You do not currently have access to this content.