By Three Dimensional X-ray Diffraction (3DXRD) microscopy it is possible to characterize microstructures non-destructively in 3 dimensions. The measurements are furthermore typically so fast that dynamics may be monitored in-situ, giving also the 4th dimension, namely the time. The 3DXRD technique is based on diffraction of high energy x-rays from third generation synchrotron sources. In the present paper the 3DXRD technique is described and it’s potentials are illustrated by examples relating to elastic and plastic strains, recovery, recrystallization and grain growth.
Volume Subject Area:
Board on Research and Technology Development
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