Yttria stabilized zirconia (YSZ) thin films have been processed on polished silicon and porous strontium-doped lanthanum manganite (LSM) substrates by liquid fuel combustion chemical vapor deposition from combustion of an aerosol jet. The aerosol jet consists of Y- and Zr- containing metalorganics dissolved in toluene and high-purity oxygen. The morphology and thickness of the deposited films have been analyzed with scanning electron microscope. On the polished silicon substrates, thin and uniform films have been obtained. The grain growth rate is of the first order of the deposition time. The film growth rate was greatly enhanced by utilizing higher precursor concentrations, proper substrate temperature and the effect of thermophoresis. However, when the porous substrate is being coated, a more complex deposition process takes place. The initial deposition seems to be favored on the surface protrusions. Therefore, the covered areas serve as nucleation sites and the grains start to grow, giving rise to larger particles and rougher surface than the films on polished silicon. To enhance the pore-sealing rate, some pre-treatments and post-treatment have been used. Moreover, deposition parameters towards fast pore sealing have been investigated. Thin and continuous films with the film thickness less than 3 μm have been obtained.
Thin YSZ Electrolyte Film Depositions on Dense and Porous Substrates
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Xu, Z, Hilton, C, Watkins, B, Yarmolenko, S, & Sankar, J. "Thin YSZ Electrolyte Film Depositions on Dense and Porous Substrates." Proceedings of the ASME 2003 International Mechanical Engineering Congress and Exposition. Materials. Washington, DC, USA. November 15–21, 2003. pp. 343-348. ASME. https://doi.org/10.1115/IMECE2003-43330
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