In this work, we investigate transmission enhancement through ridged-apertures of nanometer size in a metal film in the optical frequency range. It is demonstrated that the fundamental propagation TE10 mode concentrated in the gap between the two ridges of the aperture provides transmission efficiency higher than unity, and the size of the gap between the two ridges determines the sub-wavelength resolution. Fabry-Perot-like resonance with respect to the thickness of the aperture and the red-shift phenomena with respect to the wavelength of the incident light are observed. As a comparison, transmission through regular apertures is also computed, and is found much lower. Localized surface plasmon (LSP) is excited on the edges of the aperture in a silver film but plays a negative role with respect to the field concentration and signal contrast. With optimized geometries, the ridged apertures are capable of achieving sub-wavelength resolution in the near field with transmission efficiency above unity and high contrast.
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ASME 2003 International Mechanical Engineering Congress and Exposition
November 15–21, 2003
Washington, DC, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
0-7918-3714-9
PROCEEDINGS PAPER
Enhancement of Optical Transmission Through Planar Nano-Apertures in a Metal Film
Eric X. Jin,
Eric X. Jin
Purdue University, West Lafayette, IN
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Xianfan Xu
Xianfan Xu
Purdue University, West Lafayette, IN
Search for other works by this author on:
Eric X. Jin
Purdue University, West Lafayette, IN
Xianfan Xu
Purdue University, West Lafayette, IN
Paper No:
IMECE2003-55235, pp. 885-890; 6 pages
Published Online:
May 12, 2008
Citation
Jin, EX, & Xu, X. "Enhancement of Optical Transmission Through Planar Nano-Apertures in a Metal Film." Proceedings of the ASME 2003 International Mechanical Engineering Congress and Exposition. Electronic and Photonic Packaging, Electrical Systems and Photonic Design, and Nanotechnology. Washington, DC, USA. November 15–21, 2003. pp. 885-890. ASME. https://doi.org/10.1115/IMECE2003-55235
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