The viscoplastic constitutive properties of Sn3.9Ag0.6Cu lead-free alloy are presented and compared with baseline data from eutectic Sn63Pb37 solder. Steady-state creep models are obtained from creep and monotonic tests at three different temperatures for both solders. Based on steady-state creep results and creep test data, a transient creep model is developed for both Pb-free and Sb37Pb solders. One-dimensional incremental model of the test setup is developed to simulate constant-load creep, monotonic, and isothermal cyclic mechanical tests performed over various temperatures, strain rates and stresses using a thermo-mechanical-microstructural (TMM) test system, developed by the authors. By fitting simulation results to monotonic testing data, plastic models are also achieved. The devoloped viscoplastic constitutive models are evaluated in a two-dimensional nonlinear Finite element analysis of a PBGA352 package under a −55°C∼125°C thermal cycling environment. The viscoplastic behavior of Pb-free solder is compared with that of eutectic Sn37Pb solder.
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ASME 2003 International Mechanical Engineering Congress and Exposition
November 15–21, 2003
Washington, DC, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
0-7918-3714-9
PROCEEDINGS PAPER
Viscoplastic Constitutive Properties and Reliability of Lead-Free Sn3.9Ag0.6Cu Solder
Qian Zhang,
Qian Zhang
University of Maryland, College Park, MD
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Abhijit Dasgupta,
Abhijit Dasgupta
University of Maryland, College Park, MD
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Peter Haswell
Peter Haswell
University of Maryland, College Park, MD
Search for other works by this author on:
Qian Zhang
University of Maryland, College Park, MD
Abhijit Dasgupta
University of Maryland, College Park, MD
Peter Haswell
University of Maryland, College Park, MD
Paper No:
IMECE2003-41840, pp. 215-224; 10 pages
Published Online:
May 12, 2008
Citation
Zhang, Q, Dasgupta, A, & Haswell, P. "Viscoplastic Constitutive Properties and Reliability of Lead-Free Sn3.9Ag0.6Cu Solder." Proceedings of the ASME 2003 International Mechanical Engineering Congress and Exposition. Electronic and Photonic Packaging, Electrical Systems and Photonic Design, and Nanotechnology. Washington, DC, USA. November 15–21, 2003. pp. 215-224. ASME. https://doi.org/10.1115/IMECE2003-41840
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