We are investigating a new manufacturing process utilizing Threshold Heating and Emission from Nanotubes (THEN) to remove clusters of atoms from workpiece surfaces. A pulsed laser will locally heat a workpiece to the threshold temperature, and then electrons emitted from nanotube tips will create nanoscale features within the heated zone. This paper concentrates on modeling the temperature distribution in the workpiece caused by radiation and conduction transfer. Our finite difference model considers a Gaussian laser beam radiating through a transparent substrate onto a metallic workpiece layer. The finite difference model will eventually be integrated with thermal models of electron emission and absorption to achieve a complete model of the THEN process.
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ASME 2002 International Mechanical Engineering Congress and Exposition
November 17–22, 2002
New Orleans, Louisiana, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
0-7918-3648-7
PROCEEDINGS PAPER
Thermal Finite Difference Analysis of Threshold Heating for Nanoscale Machining
Chris A. Trinkle,
Chris A. Trinkle
University of Kentucky, Lexington, KY
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Phil Smith,
Phil Smith
University of Kentucky, Lexington, KY
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R. Ryan Vallance,
R. Ryan Vallance
University of Kentucky, Lexington, KY
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Basil T. Wong,
Basil T. Wong
University of Kentucky, Lexington, KY
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M. Pinar Mengu¨c¸
M. Pinar Mengu¨c¸
University of Kentucky, Lexington, KY
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Chris A. Trinkle
University of Kentucky, Lexington, KY
Phil Smith
University of Kentucky, Lexington, KY
R. Ryan Vallance
University of Kentucky, Lexington, KY
Basil T. Wong
University of Kentucky, Lexington, KY
M. Pinar Mengu¨c¸
University of Kentucky, Lexington, KY
Paper No:
IMECE2002-39377, pp. 507-513; 7 pages
Published Online:
June 3, 2008
Citation
Trinkle, CA, Smith, P, Vallance, RR, Wong, BT, & Mengu¨c¸, MP. "Thermal Finite Difference Analysis of Threshold Heating for Nanoscale Machining." Proceedings of the ASME 2002 International Mechanical Engineering Congress and Exposition. Electronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology. New Orleans, Louisiana, USA. November 17–22, 2002. pp. 507-513. ASME. https://doi.org/10.1115/IMECE2002-39377
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