One-dimensional (1D) materials such as various kinds of nanowires and nanotubes have attracted a lot of attention recently because of their potential applications in nanoelectronic and energy conversion devices [1–3]. As the size of low dimensional materials is confined to be comparable to the phonon mean free path, the thermal conductivity can be reduced due to boundary scattering. A theoretical study [4] further suggests that as the diameter of a Si nanowire becomes smaller than 20 nm, the phonon dispersion relation can be modified due to the boundary confinement and the phonon group velocities will be less than that of the bulk, which will also tend to reduce the thermal conductivity. A molecular dynamics (MD) simulation [5] has shown that for nanowires of cross sections ranging from 2.58 to 28.62 nm2, the thermal conductivity could be two orders of magnitude smaller than those of bulk Si crystals in a temperature range from 200 K to 500 K. In their paper, the authors also solved the Boltzmann transport equation (BTE) and showed that the MD results fit reasonably well with the BTE solutions. It is very important to experimentally verify the theoretical predictions and provide experimental data for the device design in nanoelectronic and nanoscale energy conversion devices. However, no systematic experimental studies of the size effect on the nanowire thermal conductivity have been published.
Skip Nav Destination
ASME 2002 International Mechanical Engineering Congress and Exposition
November 17–22, 2002
New Orleans, Louisiana, USA
Conference Sponsors:
- Heat Transfer Division
ISBN:
0-7918-3633-9
PROCEEDINGS PAPER
Measurement of the Silicon Nanowire Thermal Conductivity
Deyu Li,
Deyu Li
University of California at Berkeley, Berkeley, CA
Search for other works by this author on:
Arun Majumdar,
Arun Majumdar
University of California at Berkeley, Berkeley, CA
Search for other works by this author on:
Yiying Wu,
Yiying Wu
University of California at Berkeley, Berkeley, CA
Search for other works by this author on:
Peidong Yang,
Peidong Yang
University of California at Berkeley, Berkeley, CA
Search for other works by this author on:
Li Shi
Li Shi
University of Texas at Austin, Austin, TX
Search for other works by this author on:
Deyu Li
University of California at Berkeley, Berkeley, CA
Arun Majumdar
University of California at Berkeley, Berkeley, CA
Yiying Wu
University of California at Berkeley, Berkeley, CA
Peidong Yang
University of California at Berkeley, Berkeley, CA
Philip Kim
Columbia University, New York, NY
Li Shi
University of Texas at Austin, Austin, TX
Paper No:
IMECE2002-39446, pp. 207-208; 2 pages
Published Online:
June 3, 2008
Citation
Li, D, Majumdar, A, Wu, Y, Yang, P, Kim, P, & Shi, L. "Measurement of the Silicon Nanowire Thermal Conductivity." Proceedings of the ASME 2002 International Mechanical Engineering Congress and Exposition. Heat Transfer, Volume 2. New Orleans, Louisiana, USA. November 17–22, 2002. pp. 207-208. ASME. https://doi.org/10.1115/IMECE2002-39446
Download citation file:
6
Views
Related Proceedings Papers
Related Articles
Monte Carlo Simulation of Silicon Nanowire Thermal Conductivity
J. Heat Transfer (October,2005)
Hierarchical
Modeling of Heat Transfer in Silicon-Based Electronic
Devices
J. Heat Transfer (October,2010)
Electron and Phonon Thermal Conduction in Epitaxial High- T c Superconducting Films
J. Heat Transfer (February,1993)
Related Chapters
Model and Simulation of Low Elevation Ground-to-Air Fading Channel
International Conference on Instrumentation, Measurement, Circuits and Systems (ICIMCS 2011)
Study on Load Position Switching of Radial Scattering Dispenser
International Conference on Mechanical Engineering and Technology (ICMET-London 2011)
Modeling Grain Boundary Scattering in Nanocomposites
Inaugural US-EU-China Thermophysics Conference-Renewable Energy 2009 (UECTC 2009 Proceedings)