Cycling of a micromechanical switch with gold-on-gold contacts demonstrates that the contact resistance decreases and the adherence force increases. An experimental setup using a Scanning Probe Microscope (SPM) is allowing the fundamental physics of this behavior to be better understood. The setup includes two side-by-side cantilevers — one of high stiffness which applies the repeated loading and the other a standard profiling cantilever allowing in-situ measurements of topographical changes.
- Tribology Division
AFM-Based Testing and Measurements of Contact and Stiction in a Micromechanical Switch
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Chen, L, McGruer, NE, & Adams, GG. "AFM-Based Testing and Measurements of Contact and Stiction in a Micromechanical Switch." Proceedings of the ASME/STLE 2004 International Joint Tribology Conference. ASME/STLE 2004 International Joint Tribology Conference, Parts A and B. Long Beach, California, USA. October 24–27, 2004. pp. 65-68. ASME. https://doi.org/10.1115/TRIB2004-64348
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