Analog Devices has shipped over 120 million MEMS inertial sensors (accelerometers and gyros). Most are used in automotive air bag systems so high reliability is absolutely critical. the DMD die used in the Texas Instruments’ DLP image projection systems have up to 1.3 million micromirrors on each die that are designed to touch and release. the DLP product line also has a well-established record of high reliability. Clearly, both Companies have solved the problem of MEMS stiction to the extent that it no longer impacts field reliability. However, stiction remains a primary cause of failure in other micromachined products that are produced on less mature processes than those employed by high volume manufacturers like ADI and TI. This paper discusses the fundamental causes of stiction and the techniques that commercial MEMS suppliers use to suppress it.
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STLE/ASME 2003 International Joint Tribology Conference
October 26–29, 2003
Ponte Vedra Beach, Florida, USA
Conference Sponsors:
- Tribology Division
ISBN:
0-7918-3706-8
PROCEEDINGS PAPER
Stiction Suppression in High Volume MEMS Products
Jack Martin
Jack Martin
Analog Devices, Inc., Cambridge, MA
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Jack Martin
Analog Devices, Inc., Cambridge, MA
Paper No:
2003-TRIB-0266, pp. 59-62; 4 pages
Published Online:
January 7, 2009
Citation
Martin, J. "Stiction Suppression in High Volume MEMS Products." Proceedings of the STLE/ASME 2003 International Joint Tribology Conference. Contact Mechanics. Ponte Vedra Beach, Florida, USA. October 26–29, 2003. pp. 59-62. ASME. https://doi.org/10.1115/2003-TRIB-0266
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