Recent improvements in growth methodologies have decreased the grain sizes and thicknesses of polycrystalline diamond films to the nanometer range, while also increasing the film uniformity and growth rate and preserving the outstanding mechanical properties of diamond. This is rendering such films more technologically and commercially viable. Ultrananocrystalline diamond (UNCD) are the thinnest (<200 nm) and smoothest (Rq < 10 nm) diamond films available.[1] These films demonstrated self-mated friction coefficients as low as near frictionless carbon (μ < 0.007) in environments with sufficient humidity, and the corresponding wear rates could not be measured using scanning white-light interferometry. However, their response to environmental conditions (e.g. relative humidity, ambient species, velocity, and temperature) had not been systematically explored in the past. This study focused on identifying conditions that contribute to favorable tribological performance. We find low friction performance at humidity levels below 1.5% in both nitrogen and argon environments.
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STLE/ASME 2008 International Joint Tribology Conference
October 20–22, 2008
Miami, Florida, USA
Conference Sponsors:
- Tribology Division
ISBN:
978-0-7918-4336-9
PROCEEDINGS PAPER
Environmental Performance Limits of Ultrananocrystalline Diamond Films
Matthew A. Hamilton,
Matthew A. Hamilton
University of Pennsylvania, Philadelphia, PA
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Andrew R. Konicek,
Andrew R. Konicek
University of Pennsylvania, Philadelphia, PA
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David S. Grierson,
David S. Grierson
University of Wisconsin-Madison, Madison, WI
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A. V. Sumant,
A. V. Sumant
Argonne National Laboratory, Argonne, IL
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Orlando Auciello,
Orlando Auciello
Argonne National Laboratory, Argonne, IL
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W. Gregory Sawyer,
W. Gregory Sawyer
University of Florida, Gainesville, FL
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Robert W. Carpick
Robert W. Carpick
University of Pennsylvania, Philadelphia, PA
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Matthew A. Hamilton
University of Pennsylvania, Philadelphia, PA
Andrew R. Konicek
University of Pennsylvania, Philadelphia, PA
David S. Grierson
University of Wisconsin-Madison, Madison, WI
A. V. Sumant
Argonne National Laboratory, Argonne, IL
Orlando Auciello
Argonne National Laboratory, Argonne, IL
W. Gregory Sawyer
University of Florida, Gainesville, FL
Robert W. Carpick
University of Pennsylvania, Philadelphia, PA
Paper No:
IJTC2008-71198, pp. 9-10; 2 pages
Published Online:
June 5, 2009
Citation
Hamilton, MA, Konicek, AR, Grierson, DS, Sumant, AV, Auciello, O, Sawyer, WG, & Carpick, RW. "Environmental Performance Limits of Ultrananocrystalline Diamond Films." Proceedings of the STLE/ASME 2008 International Joint Tribology Conference. STLE/ASME 2008 International Joint Tribology Conference. Miami, Florida, USA. October 20–22, 2008. pp. 9-10. ASME. https://doi.org/10.1115/IJTC2008-71198
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