In small devices such as micro-electro-mechanical systems (MEMS) and nano-electro-mechanical systems (NEMS), adhesion and friction forces make them less reliable with unacceptable performance [1]. These forces need to be completely understood to make advances in the systems. In our previous research, it has been proven that using a functional material, polyvinylidene fluoride (PVDF), both stiction and friction could be modified or turned on-off. The phase of the polymer affects the adhesion and friction forces. β phase contents reduced the adhesion forces due to its less electrostatic forces. With higher phase difference, higher roughness of the polymer surface got higher friction forces. In this research, we continue our investigation in understanding microstructure aspects of the PVDF, its dipole structure, and piezoelectricity on surface adhesion and friction. Doing so, we used an atomic force microscope (AFM) with an external potential to study the piezeoelectrical behavior. The effects of the electrical potential on adhesion and friction force were tested. It was shown that when the electrical potential increases, the surface roughness increases under the AFM, however not with a profilometer. Changes were also found in adhesion. This paper discusses the mechanisms of nanoscale adhesion and friction of the PVDF with an AFM tip along with the microstructures and dipole structures. This article contributes to understanding in fundamental adhesion and friction forces at a nanometer length scale.
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ASME/STLE 2007 International Joint Tribology Conference
October 22–24, 2007
San Diego, California, USA
Conference Sponsors:
- Tribology Division
ISBN:
0-7918-4810-8
PROCEEDINGS PAPER
Relations of Microstructure, Piezoelectricity, and Surface Forces at Nanoscale
Hyungoo Lee,
Hyungoo Lee
Texas A&M University, College Station, TX
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Rodrigo Cooper,
Rodrigo Cooper
Texas A&M University, College Station, TX
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Bartosz Mika,
Bartosz Mika
Texas A&M University, College Station, TX
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Hong Liang
Hong Liang
Texas A&M University, College Station, TX
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Hyungoo Lee
Texas A&M University, College Station, TX
Rodrigo Cooper
Texas A&M University, College Station, TX
Bartosz Mika
Texas A&M University, College Station, TX
Hong Liang
Texas A&M University, College Station, TX
Paper No:
IJTC2007-44456, pp. 893-895; 3 pages
Published Online:
March 23, 2009
Citation
Lee, H, Cooper, R, Mika, B, & Liang, H. "Relations of Microstructure, Piezoelectricity, and Surface Forces at Nanoscale." Proceedings of the ASME/STLE 2007 International Joint Tribology Conference. ASME/STLE 2007 International Joint Tribology Conference, Parts A and B. San Diego, California, USA. October 22–24, 2007. pp. 893-895. ASME. https://doi.org/10.1115/IJTC2007-44456
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