The authors have carried out extensive measurements of electron triboemission from the scratching of ceramics and semiconductors that are briefly summarized in this paper. Analysis of the frequency-domain distribution of typical triboemission count-pulse outputs suggested that their occurrence is not Poisson’s (e.g., it is not random). This paper presents a study on the hypothesis of deterministic-chaos origin for triboemission data. Electron triboemission outputs from the ceramics alumina, sapphire, silicon nitride and the semiconductors Si and Ge are analyzed by means of extracting deterministic-chaos metrics. The results suggest that the low-level electron-emission components may be described by multiplicative processes of random initiation, while the superimposed large burst-type components may be of deterministic origin.
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A Deterministic-Chaos Study of Electron Triboemission Outputs
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Molina, GJ, Furey, MJ, & Kajdas, C. "A Deterministic-Chaos Study of Electron Triboemission Outputs." Proceedings of the STLE/ASME 2006 International Joint Tribology Conference. Part A: Tribomaterials; Lubricants and Additives; Elastohydrodynamic Lubrication; Hydrodynamic Lubrication and Fluid Film Bearings; Rolling Element Bearings; Engine Tribology; Machine Components Tribology; Contact Mechanics. San Antonio, Texas, USA. October 23–25, 2006. pp. 1-7. ASME. https://doi.org/10.1115/IJTC2006-12005
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