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1-20 of 67
5th International Conference on Micro- and Nanosystems
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Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 159-166, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47978
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 469-473, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47199
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 317-325, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-48848
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 245-253, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-48601
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 551-555, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-48737
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 167-176, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-48008
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 475-480, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47455
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 401-404, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47856
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 25-32, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47528
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 327-334, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47717
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 481-490, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47503
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 17-24, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47320
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 405-412, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47883
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 255-261, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-48862
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 33-39, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47532
Proceedings Papers
Sanjay Mathur, Lin Sun, Shankhadeep Das, Dimitrios Peroulis, Andrew Kovacs, Juan Zeng, Jayathi Y. Murthy
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 87-100, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47260
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 397-399, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47681
Proceedings Papers
Vijay Kumar, J. William Boley, Yushi Yang, Hendrik Ekowaluyo, Jacob K. Miller, George T.-C. Chiu, Jeffrey F. Rhoads
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 177-186, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-48199
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 41-49, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47653
Proceedings Papers
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 263-267, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-48888
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