Technological advancement in cell and microscopy imaging generate a high demand for complex image analysis techniques. Image processing techniques are powerful tools to assess the images and extract information for quantization and evaluation of regions. It is crucial to develop advanced automatic cell segmentation methods with capability to analyze image data with high level of accuracy. In this paper, a quantitative technique is developed to count the number of cells from phase contrast microscopy. The technique selects region of interests (ROI) in the cell images and it measures the cell locations within ROI in a specific microfluidic device. The cell location is an important factor which will affect the flow pattern in the microfluidic device and consequently induced shear stresses.
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ASME 2015 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 2–5, 2015
Boston, Massachusetts, USA
Conference Sponsors:
- Design Engineering Division
- Computers and Information in Engineering Division
ISBN:
978-0-7918-5710-6
PROCEEDINGS PAPER
Automated Cell Segmentation Method for Extracting Cell Information From Phase Contrast Microscopy of a Microfluidic Device
Masoud Khabiry,
Masoud Khabiry
Northeastern University, Boston, MA
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Nader Jalili
Nader Jalili
Northeastern University, Boston, MA
Search for other works by this author on:
Masoud Khabiry
Northeastern University, Boston, MA
Nader Jalili
Northeastern University, Boston, MA
Paper No:
DETC2015-47451, V003T14A010; 5 pages
Published Online:
January 19, 2016
Citation
Khabiry, M, & Jalili, N. "Automated Cell Segmentation Method for Extracting Cell Information From Phase Contrast Microscopy of a Microfluidic Device." Proceedings of the ASME 2015 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 3: 17th International Conference on Advanced Vehicle Technologies; 12th International Conference on Design Education; 8th Frontiers in Biomedical Devices. Boston, Massachusetts, USA. August 2–5, 2015. V003T14A010. ASME. https://doi.org/10.1115/DETC2015-47451
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