We present analytical solutions of the electrostatically actuated initially deformed cantilever beam problem. We use a continuous Euler-Bernoulli beam model combined with a single-mode Galerkin approximation. We derive simple analytical expressions for two commonly observed deformed beams configurations: the curled and tilted configurations. The derived analytical formulas are validated by comparing their results to experimental data in the literature and numerical results of a multi-mode reduced order model. The derived expressions do not involve any complicated integrals or complex terms and can be conveniently used by designers for quick, yet accurate, estimations. The formulas are found to yield accurate results for most commonly encountered microbeams of initial tip deflections of few microns. For largely deformed beams, we found that these formulas yield less accurate results due to the limitations of the single-mode approximations they are based on. In such cases, multi-mode reduced order models need to be utilized.
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ASME 2014 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 17–20, 2014
Buffalo, New York, USA
Conference Sponsors:
- Design Engineering Division
- Computers and Information in Engineering Division
ISBN:
978-0-7918-4635-3
PROCEEDINGS PAPER
Simple and Accurate Analytical Solutions of the Electrostatically Actuated Curled Beam Problem
Mohammad I. Younis
Mohammad I. Younis
State University of New York, Binghamton, NY
King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi Arabia
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Mohammad I. Younis
State University of New York, Binghamton, NY
King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi Arabia
Paper No:
DETC2014-34918, V004T09A011; 8 pages
Published Online:
January 13, 2015
Citation
Younis, MI. "Simple and Accurate Analytical Solutions of the Electrostatically Actuated Curled Beam Problem." Proceedings of the ASME 2014 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 4: 19th Design for Manufacturing and the Life Cycle Conference; 8th International Conference on Micro- and Nanosystems. Buffalo, New York, USA. August 17–20, 2014. V004T09A011. ASME. https://doi.org/10.1115/DETC2014-34918
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