The function-structure (F-S) Map expresses the high-level structure of a design. It is often used in the early stage of conceptual design and serves as the starting point for a number of design tools like quality function deployment, failure mode and effects analysis, and more. On the other hand, in designing risk products whose failure can result in serious damage to the quality of human health or the society, the designer often uses tools like failure mode and effect analysis or fault tree analysis to detect weaknesses in design before the products are shaped. Failures, nonetheless, take place and cause negative impact to the society. It is then that the designer or other experts review the design to find flaws in the failure analysis tree or find elements or links in the graph that the designer overlooked. In other words, pre-production failure analysis is limited to the designer’s knowledge and insight. This paper proposes a way to make use of failure knowledge with past accident cases by constructing the F-S Map for the failed products and storing the information in a failure database. Designers can then compare the F-S Map for new products with linked representation of past failure cases and realize scenarios of failure he did not recognize or have to design carefully.
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ASME 2014 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 17–20, 2014
Buffalo, New York, USA
Conference Sponsors:
- Design Engineering Division
- Computers and Information in Engineering Division
ISBN:
978-0-7918-4635-3
PROCEEDINGS PAPER
Reconstructing the Designers Intention for Reusing Failure Information
Masayuki Nakao,
Masayuki Nakao
The University of Tokyo, Tokyo, Japan
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Michelle Lovella M. Ota
Michelle Lovella M. Ota
SYDROSE LP, Tokyo, Japan
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Kenji Iino
SYDROSE LP, San Jose, CA
Masayuki Nakao
The University of Tokyo, Tokyo, Japan
Michelle Lovella M. Ota
SYDROSE LP, Tokyo, Japan
Paper No:
DETC2014-34577, V004T06A037; 8 pages
Published Online:
January 13, 2015
Citation
Iino, K, Nakao, M, & Ota, MLM. "Reconstructing the Designers Intention for Reusing Failure Information." Proceedings of the ASME 2014 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 4: 19th Design for Manufacturing and the Life Cycle Conference; 8th International Conference on Micro- and Nanosystems. Buffalo, New York, USA. August 17–20, 2014. V004T06A037. ASME. https://doi.org/10.1115/DETC2014-34577
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