This paper investigates electrostatically actuated Carbon Nano-Tubes (CNT) cantilevers biosensors using the Reduced Order Model (ROM) method. Forces acting on the CNT are electrostatic, damping, and van der Waals. The electrostatic actuation is given by soft AC voltage. Van der Waals forces are significant for gaps between the CNT and a ground plate lower than 100 nm. Both forces electrostatic and van der Waals are nonlinear. CNT undergoes nonlinear parametric dynamics. ROM is used to investigate the system under soft excitations and/or weak nonlinearities. The frequency-amplitude response is found in the case of primary resonance and compared to the Method of Multiple Scales (MMS). The CNT biosensor is to be used for mass detection applications.
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ASME 2013 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 4–7, 2013
Portland, Oregon, USA
Conference Sponsors:
- Design Engineering Division
- Computers and Information in Engineering Division
ISBN:
978-0-7918-5584-3
PROCEEDINGS PAPER
Reduced Order Model of Electrostatically Actuated Carbon Nanotube Cantilever Biosensors for Primary Resonance
Dumitru I. Caruntu,
Dumitru I. Caruntu
University of Texas Pan American, Edinburg, TX
Search for other works by this author on:
Le Luo
Le Luo
University of Texas Pan American, Edinburg, TX
Search for other works by this author on:
Dumitru I. Caruntu
University of Texas Pan American, Edinburg, TX
Le Luo
University of Texas Pan American, Edinburg, TX
Paper No:
DETC2013-12433, V001T09A002; 5 pages
Published Online:
February 12, 2014
Citation
Caruntu, DI, & Luo, L. "Reduced Order Model of Electrostatically Actuated Carbon Nanotube Cantilever Biosensors for Primary Resonance." Proceedings of the ASME 2013 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 1: 15th International Conference on Advanced Vehicle Technologies; 10th International Conference on Design Education; 7th International Conference on Micro- and Nanosystems. Portland, Oregon, USA. August 4–7, 2013. V001T09A002. ASME. https://doi.org/10.1115/DETC2013-12433
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