In this work we investigate the stability of parallel-plate electrostatic MEMS resonators using a delayed feedback controller. Two case studies are investigated: a capacitive sensor made of cantilever beams with a proof mass at their tip and a clamped-clamped microbeam. Dover-cliff integrity curves and basin-of-attraction analysis are used for the stability assessment of the frequency response of the resonators for several scenarios of positive and negative gain in the controller. It is found that, in the case of a positive gain, a velocity or a displacement feedback controller can be used to effectively enhance the stability of the resonators. This is confirmed by an increase in the area of the safe basin of attraction and in shifting the Dover-cliff curve upward. On the other hand, it is shown that a negative gain can significantly weaken the stability of the resonators. This can be of useful use in MEMS for actuation applications, such as in the case of capacitive switches, to lower the activation voltage of these devices and to ensure their trigger under all initial conditions.
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ASME 2010 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 15–18, 2010
Montreal, Quebec, Canada
Conference Sponsors:
- Design Engineering Division and Computers in Engineering Division
ISBN:
978-0-7918-4412-0
PROCEEDINGS PAPER
Stability Analysis of Electrostatically Actuated Resonators With Delayed Feedback Controller
Mohammad I. Younis
Mohammad I. Younis
SUNY at Binghamton University, Binghamton, NY
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Fadi Alsaleem
Microstaq Inc., Austin, TX
Mohammad I. Younis
SUNY at Binghamton University, Binghamton, NY
Paper No:
DETC2010-29036, pp. 785-793; 9 pages
Published Online:
March 8, 2011
Citation
Alsaleem, F, & Younis, MI. "Stability Analysis of Electrostatically Actuated Resonators With Delayed Feedback Controller." Proceedings of the ASME 2010 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 4: 12th International Conference on Advanced Vehicle and Tire Technologies; 4th International Conference on Micro- and Nanosystems. Montreal, Quebec, Canada. August 15–18, 2010. pp. 785-793. ASME. https://doi.org/10.1115/DETC2010-29036
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