The ability of atomic force microscopy (AFM) to acquire tip-sample interaction force curves has allowed researchers to understand the mechanical behavior of numerous materials at the nanoscale. However, AFM force spectroscopy with the most commonly used techniques can be a slow process for non-uniform samples, as it often requires the measurement to be performed at one fixed surface point at a time. In this paper we present two dynamic AFM based spectroscopy methods, one requiring operation in single-frequency-modulation mode and another using dual-frequency-modulation, which could allow a more rapid acquisition of topography and tip-sample interaction force curves. Numerical simulation results are provided along with discussions on the benefits and limitations of both.

This content is only available via PDF.
You do not currently have access to this content.