In this study, a process planning method is presented for the Mask Projection Micro-Stereolithography process with the ability to cure a film of various thicknesses on flat or curved transparent substrates. In this process, incident radiation, patterned by a dynamic mask, passes through a transparent substrate to cure photopolymer resin layers that grow progressively from the substrate surface. When compared to existing Stereolithography techniques, this technique eliminates the necessity of recoating, reducing process time and improving accuracy. A regression model is adopted in this process plan to accurately control the curing front on the substrate. An existing Mask Projection Micro-Stereolithography process planning method is extended to account for radiation transmission through the substrate. The models are verified using experiments.
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ASME 2009 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 30–September 2, 2009
San Diego, California, USA
Conference Sponsors:
- Design Engineering Division and Computers in Engineering Division
ISBN:
978-0-7918-4899-9
PROCEEDINGS PAPER
A Process Planning Method for Thin Film Mask Projection Micro-Stereolithography
Amit S. Jariwala,
Amit S. Jariwala
Georgia Institute of Technology, Atlanta, GA
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Fei Ding,
Fei Ding
Georgia Institute of Technology, Atlanta, GA
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Xiayun Zhao,
Xiayun Zhao
Georgia Institute of Technology, Atlanta, GA
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David W. Rosen
David W. Rosen
Georgia Institute of Technology, Atlanta, GA
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Amit S. Jariwala
Georgia Institute of Technology, Atlanta, GA
Fei Ding
Georgia Institute of Technology, Atlanta, GA
Xiayun Zhao
Georgia Institute of Technology, Atlanta, GA
David W. Rosen
Georgia Institute of Technology, Atlanta, GA
Paper No:
DETC2009-87532, pp. 685-694; 10 pages
Published Online:
July 29, 2010
Citation
Jariwala, AS, Ding, F, Zhao, X, & Rosen, DW. "A Process Planning Method for Thin Film Mask Projection Micro-Stereolithography." Proceedings of the ASME 2009 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 2: 29th Computers and Information in Engineering Conference, Parts A and B. San Diego, California, USA. August 30–September 2, 2009. pp. 685-694. ASME. https://doi.org/10.1115/DETC2009-87532
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