To match for complex product function and to solve insufficient computer aid for functional design, the Extended-Effect driven Function-Behavior-Structure (EE-FBS) model is constructed. A multi-flow and multi-pole effect model is presented by extending the one with single input/output flow in TRIZ. Four effect patterns and three reasoning methods are proposed to create effect chains. The FBS model is extended to an EE-FBS model based on effect through the description of the law of mapping overall function to external behavior, from external behavior to sub-behavior, etc. A functional design process was presented based on the EE-FBS model, and the computer-aided functional design software system is developed. A design example for functional design of Chinese dropping pill medicine demonstrates the proposed method is feasible.
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ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 3–6, 2008
Brooklyn, New York, USA
Conference Sponsors:
- Design Engineering Division and Computers in Engineering Division
ISBN:
978-0-7918-4327-7
PROCEEDINGS PAPER
E-CAFD: Extended-Effect Driven Computer-Aided Functional Design Available to Purchase
Guozhong Cao,
Guozhong Cao
Hebei University of Technology, Tianjin, China
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Haixia Guo,
Haixia Guo
Hebei University of Technology, Tianjin, China
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Runhua Tan
Runhua Tan
Hebei University of Technology, Tianjin, China
Search for other works by this author on:
Guozhong Cao
Hebei University of Technology, Tianjin, China
Haixia Guo
Hebei University of Technology, Tianjin, China
Runhua Tan
Hebei University of Technology, Tianjin, China
Paper No:
DETC2008-49382, pp. 159-169; 11 pages
Published Online:
July 13, 2009
Citation
Cao, G, Guo, H, & Tan, R. "E-CAFD: Extended-Effect Driven Computer-Aided Functional Design." Proceedings of the ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 3: 28th Computers and Information in Engineering Conference, Parts A and B. Brooklyn, New York, USA. August 3–6, 2008. pp. 159-169. ASME. https://doi.org/10.1115/DETC2008-49382
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